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5 Tips for Improving Development Efficiency and Test Throughput for Mixed-Signal Test Systems

Track: Test Systems Session Type: Tips and Tricks Abstract: To meet time-to-market demands for increasingly complex devices while maintaining proper test coverage, engineers must quickly develop mixed-signal test systems that are both faster and more comprehensive than ever before. Examine architectures that you can use to accelerate complex mixed-signal tests across both validation and production, and explore real-world examples of how this can reduce the overall test cost for organizations. Examples range from improving analog measurement noise and response time to using FPGA-based instrumentation for custom test sequencing. Speaker: Ravi Raghavan, NI

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