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NIWeek 2011 Special Focus – RF and Wireless Test Summit

jaking
NI Employee (retired)

Over the next two months, we'll feature NIWeek highlights to get you excited about what NIWeek 2011 has to offer.

The RF and Wireless Test Summit will focus on wireless trends, emerging instrumentation technologies and innovative test techniques that will help you gain a better understanding of a range of technologies including FPGAs, multicore CPUs, LTE, multiple input, multiple output (MIMO), and time-domain analysis. Summit presenters include Averna, Phase Matrix Inc., AWR, and octoScope Inc.

RF and Wireless Test Summit sessions include:

  • Microwave Frequency Synthesizers: Trends and Solutions – Compare various synthesizer techniques in terms of performance, circuit complexity and cost impact and gain a high level introduction to a low-cost, high-performance synthesizer
  • Linking RF Design and Test: Introduction to Hardware-in-the-Loop Testing – Gain an in-depth understanding of AWR simulation tools and learn how you can use them in conjunction with RF vector signal generators and analyzers to validate performance of the simulated model
  • Over-the-Air Test Methods and Metrics – Learn how modern smart phones with cellular, 3G/4G, Wi-Fi, Bluetooth, and GPS radios are accelerating the move towards over-the-air testing due to a sheer number of connections
  • Advanced RF Signal Analyzer Measurement Techniques – Examine the trade-offs between a number of signal analyzer settings including reference level, LO power, and IF bandwidth and their impact on both measurement accuracy and repeatability
  • The Art of Benchmarking Measurement Speed:  PXI Versus Benchtop Instruments – Discuss trade-offs between measurement settings and walk through a benchmark comparison of rack-and-stack instruments versus PXI

>> Learn more about the RF and Wireless Test Summit and register for NIWeek.