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2011 GSDAA Finalist: Texas Instruments Increases Firmware Test Platform Throughput, Coverage, and Reliability with NI Hardware and Software
2011 Automated Test Finalist
Texas Instruments Increases Firmware Test Platform Throughput, Coverage, and Reliability with NI Hardware and Software
Author: Sambit Panigrahi, Shirish Kavoor, Texas Instruments
Challenge: Developing a modular test solution that is abstract, scalable, modular, and easy to use; supports test sequencing across hundreds of power management ICs (PMIC); and interacts with multiple instruments, evaluation modules, and source measure units (SMUs).
Solution: Using NI LabVIEW software and NI TestStand to build a flexible and modular automated test solution that can test several PMICs with different requirements, communications buses, and protocols; and is easy to use for engineers who do not have computer science backgrounds.
To vote for this submission for the 2011 GSDAA Community's Choice Award Winner, be sure to "Like" this document. (Click on the "Like" symbol in the bottom right corner of this window.)
To read the entire paper for this submission, download and view the PDF attachment on this document.
