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GSDAA Finalist: Siemens Uses CompactRIO, LabVIEW, and DIAdem to Determine the Root Cause of Damaging High-Voltage Transients

To read the entire paper for this submission, download and view the PDF attachment on this document.

Category: Transportation

Author: Ryan Parkinson, Jacob Cassinat

Challenge: Preventing light-rail car failure caused by unidentifed electrical high-voltage transients.

Solution: Combining the benefits of the field-programmable gate array (FPGA) and processor in NI CompactRIO hardware to create a rugged, semipermanent monitoring system that records multiple data formats and rates, synchronizes the data, and performs real-time analysis to remotely monitor sensors in an industrial environment for extended durations.

>> Learn more about the Graphical System Design Achievement Awards, the annual technical paper conte...

To vote for this submission for the 2012 GSDAA Community's Choice Award Winner, be sure to "LIKE" this document. (Click on the "Like" symbol in the bottom right corner of this window.)

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